m (Added categories.) |
(Added modeling part.) |
||
Line 14: | Line 14: | ||
==Description: Boundary Condition Independent Thermal Model== |
==Description: Boundary Condition Independent Thermal Model== |
||
<figure id="fig1">[[File:ThermalModel.jpg|490px|thumb|right|<caption>A 2D-axisymmetrical model of the micro-thruster unit (not scaled). A heater is shown by a red spot.</caption>]]</figure> |
<figure id="fig1">[[File:ThermalModel.jpg|490px|thumb|right|<caption>A 2D-axisymmetrical model of the micro-thruster unit (not scaled). A heater is shown by a red spot.</caption>]]</figure> |
||
+ | |||
+ | A benchmark for the heat transfer problem with variable film coefficients is presented. |
||
+ | It can be used to apply parametric model reduction algorithms to a linear first-order problem. |
||
+ | |||
+ | ===Modeling=== |
||
One of important requirements for a compact thermal model is that it should be boundary condition independent. |
One of important requirements for a compact thermal model is that it should be boundary condition independent. |
||
This means that a chip producer does not know conditions under which the chip will be used and hence the chip compact thermal model must allow an engineer to research on how the change in the environment influences the chip temperature. |
This means that a chip producer does not know conditions under which the chip will be used and hence the chip compact thermal model must allow an engineer to research on how the change in the environment influences the chip temperature. |
||
− | The chip benchmarks representing boundary condition independent requirements are described in |
+ | The chip benchmarks representing boundary condition independent requirements are described in <ref name="lasance2001"/>. |
− | <ref name="lasance2001"/>. |
||
+ | Let us briefly describe the problem mathematically. |
||
− | Mathematically, the problem is that the thermal problem is modeled by the heat transfer partial differential equation when the heat exchange through device interfaces is modeled by convection boundary conditions. |
||
+ | The thermal problem can be modeled by the heat transfer partial differential equation |
||
− | The latter contains the film coefficient, <math>h_i</math>, to describe the heat exchange for the <math>i</math>-th interface. |
||
⚫ | |||
− | :<math> |
+ | :<math id="eq1"> |
+ | \begin{align} |
||
− | E \frac{\partial T}{\partial t} = (A + \sum_i h_i A_i) T(t) + B |
||
+ | \nabla \cdot (\kappa(r)\nabla T(r,t)) + Q(r,t) - \rho(r)C_{p}(r)\frac{\partial T(r,t)}{\partial t} & = 0, & (1) |
||
+ | \end{align} |
||
</math> |
</math> |
||
− | + | with <math>r</math> is the position, <math>t</math> is the time, <math>\kappa</math> is the thermal conductivity of the material, <math>C_{p}</math> is the specific heat capacity, <math>\rho</math> is the mass density, <math>Q</math> is the heat generation rate, and <math>T</math> is the unknown temperature distribution to be determined. |
|
+ | The heat exchange through device interfaces is usually modeled by convection boundary conditions |
||
+ | :<math id="eq2"> |
||
⚫ | |||
+ | \begin{align} |
||
+ | q & = h_{i}(T - T_{bulk}), & (2) |
||
+ | \end{align} |
||
+ | </math> |
||
+ | |||
+ | where <math>q</math> is the heat flow through a given point, <math>h_{i}</math> is the film coefficient to describe the heat exchange for the <math>i</math>-th interface, <math>T</math> is the local temperature at this point, and <math>T_{bulk}</math> is the bulk temperature in the neighboring phase (in most cases <math>T_{bulk} = 0</math>). |
||
+ | |||
⚫ | |||
+ | |||
+ | :<math id="eq3"> |
||
+ | \begin{align} |
||
+ | E \dot{x}(t) & = (A + \sum_{i} h_{i} A_{i})x(t) + Bu(t), & (3) |
||
+ | \end{align} |
||
+ | </math> |
||
+ | |||
+ | where <math>E</math> and <math>A</math> are the device system matrices, <math>A_i</math> is the diagonal matrix due to the discretization of equation [[#eq2|(2)]] for the <math>i</math>-th interface, <math>x(t)</math> is the vector with unknown temperatures. |
||
+ | |||
⚫ | |||
A chip producer specifies the system matrices but the film coefficient, <math>h_i</math>, is controlled later on by another engineer. |
A chip producer specifies the system matrices but the film coefficient, <math>h_i</math>, is controlled later on by another engineer. |
||
As such, any reduced model to be useful should preserve <math>h_i</math> in the symbolic form. |
As such, any reduced model to be useful should preserve <math>h_i</math> in the symbolic form. |
||
This problem can be mathematically expressed as parametric model reduction<ref name="weile1999"/><ref name="gunupudi2003"/><ref name="daniel2004"/>. |
This problem can be mathematically expressed as parametric model reduction<ref name="weile1999"/><ref name="gunupudi2003"/><ref name="daniel2004"/>. |
||
− | Unfortunately, the benchmark from |
+ | Unfortunately, the benchmark from <ref name="lasance2001"/> is not available in the computer readable format. |
− | <ref name="lasance2001"/> is not available in the computer readable format. |
||
For research purposes, we have modified a [[Micropyros_Thruster|Micropyros Thruster benchmark]] (see <xr id="fig1"/>). |
For research purposes, we have modified a [[Micropyros_Thruster|Micropyros Thruster benchmark]] (see <xr id="fig1"/>). |
||
In the context of the present work, the model is as a generic example of a device with a single heat source when the generated heat dissipates through the device to the surroundings. The exchange between surrounding and the device is modeled by convection boundary conditions with different film coefficients at the top, <math>h_{top}</math>, bottom, <math>h_{bottom}</math>, and the side, <math>h_{side}</math>. |
In the context of the present work, the model is as a generic example of a device with a single heat source when the generated heat dissipates through the device to the surroundings. The exchange between surrounding and the device is modeled by convection boundary conditions with different film coefficients at the top, <math>h_{top}</math>, bottom, <math>h_{bottom}</math>, and the side, <math>h_{side}</math>. |
||
− | From this viewpoint, it is quite similar to a chip model used as a benchmark in |
+ | From this viewpoint, it is quite similar to a chip model used as a benchmark in <ref name="lasance2001"/>. |
− | <ref name="lasance2001"/>. |
||
The goal of parametric model reduction in this case is to preserve <math>h_{top}</math>, <math>h_{bottom}</math>, and <math>h_{side}</math> in the reduced model in the symbolic form. |
The goal of parametric model reduction in this case is to preserve <math>h_{top}</math>, <math>h_{bottom}</math>, and <math>h_{side}</math> in the reduced model in the symbolic form. |
||
Line 46: | Line 68: | ||
The model has been made in [http://www.ansys.com/ ANSYS] and system matrices have been extracted by means of [http://portal.uni-freiburg.de/imteksimulation/downloads/mor4fem mor4fem] <ref name="rudnyi2004"/>. |
The model has been made in [http://www.ansys.com/ ANSYS] and system matrices have been extracted by means of [http://portal.uni-freiburg.de/imteksimulation/downloads/mor4fem mor4fem] <ref name="rudnyi2004"/>. |
||
The benchmark contains a constant load vector. The input function equal to one corresponds to the constant input power of <math>15 mW</math>. |
The benchmark contains a constant load vector. The input function equal to one corresponds to the constant input power of <math>15 mW</math>. |
||
+ | |||
+ | ===Discretization=== |
||
+ | |||
+ | A 2D-axisymmetric microthruster model (T2DAL in ... |
||
The linear ordinary differential equations of first order are written as: |
The linear ordinary differential equations of first order are written as: |
Revision as of 11:04, 25 April 2018
Note: This page has not been verified by our editors.
Description: Boundary Condition Independent Thermal Model
A benchmark for the heat transfer problem with variable film coefficients is presented. It can be used to apply parametric model reduction algorithms to a linear first-order problem.
Modeling
One of important requirements for a compact thermal model is that it should be boundary condition independent. This means that a chip producer does not know conditions under which the chip will be used and hence the chip compact thermal model must allow an engineer to research on how the change in the environment influences the chip temperature. The chip benchmarks representing boundary condition independent requirements are described in [1].
Let us briefly describe the problem mathematically. The thermal problem can be modeled by the heat transfer partial differential equation
with is the position,
is the time,
is the thermal conductivity of the material,
is the specific heat capacity,
is the mass density,
is the heat generation rate, and
is the unknown temperature distribution to be determined.
The heat exchange through device interfaces is usually modeled by convection boundary conditions
where is the heat flow through a given point,
is the film coefficient to describe the heat exchange for the
-th interface,
is the local temperature at this point, and
is the bulk temperature in the neighboring phase (in most cases
).
After the discretization of equations (1) and (2) one obtains a system of ordinary differential equations as follows
where and
are the device system matrices,
is the diagonal matrix due to the discretization of equation (2) for the
-th interface,
is the vector with unknown temperatures.
In terms of the equation (3) above, the engineering requirements read as follows.
A chip producer specifies the system matrices but the film coefficient, , is controlled later on by another engineer.
As such, any reduced model to be useful should preserve
in the symbolic form.
This problem can be mathematically expressed as parametric model reduction[2][3][4].
Unfortunately, the benchmark from [1] is not available in the computer readable format.
For research purposes, we have modified a Micropyros Thruster benchmark (see xx--CrossReference--dft--fig1--xx).
In the context of the present work, the model is as a generic example of a device with a single heat source when the generated heat dissipates through the device to the surroundings. The exchange between surrounding and the device is modeled by convection boundary conditions with different film coefficients at the top, , bottom,
, and the side,
.
From this viewpoint, it is quite similar to a chip model used as a benchmark in [1].
The goal of parametric model reduction in this case is to preserve
,
, and
in the reduced model in the symbolic form.
We have used a 2D-axisymmetric microthruster model (T2DAL in Micropyros Thruster).
The model has been made in ANSYS and system matrices have been extracted by means of mor4fem [5].
The benchmark contains a constant load vector. The input function equal to one corresponds to the constant input power of .
Discretization
A 2D-axisymmetric microthruster model (T2DAL in ...
The linear ordinary differential equations of first order are written as:
where and
are the symmetric sparse system matrices (heat capacity and heat conductivity matrix),
is the load vector,
is the output matrix,
,
, and
are the diagonal matrices from the discretization of the convection boundary conditions and
is the vector of unknown temperatures.
The numerical values of film coefficients, ,
, and
can be from
to
. Typical important sets film coefficients can be found in
[1]. The allowable approximation error is
[1].
The benchmark has been used in [6][7] where the problem is also described in more detail.
Origin
This benchmark is part of the Oberwolfach Benchmark Collection[8]; No. 38865, see [9].
Data
Download matrices in the Matrix Market format:
- T2DAL_BCI.tar.gz, 218.7 kB.
The matrix name is used as an extension of the matrix file. File T2DAL_BCI.C.names contains a list of output names written consecutively.
Dimensions
System structure:
System dimensions:
,
,
,
,
,
,
.
Parameter ranges:
,
,
.
References
- ↑ 1.0 1.1 1.2 1.3 1.4 C.J.M. Lasance, "Two benchmarks to facilitate the study of compact thermal modeling phenomena", IEEE Transactions on Components and Packaging Technologies, 24: 559--565, 2001.
- ↑ D.S. Weile, E. Michielssen, E. Grimme, K. Gallivan, "A method for generating rational interpolant reduced order models of two-parameter linear systems", Applied Mathematics Letters, 12: 93--102, 1999.
- ↑ P. K. Gunupudi, R. Khazaka, M. S. Nakhla, T. Smy, and D. Celo, "Passive parameterized time-domain macromodels for high-speed transmission-line networks", IEEE Transactions on Microwave Theory and Techniques, 51: 2347--2354, 2003.
- ↑ L. Daniel, O.C. Siong, L.S. Chay, K.H. Lee, and J. White, "A Multiparameter Moment-Matching Model-Reduction Approach for Generating Geometrically Parameterized Interconnect Performance Models", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 23: 678--693, 2004.
- ↑ E.B. Rudnyi and J.G. Korvink, "Model Order Reduction of MEMS for Efficient Computer Aided Design and System Simulation", MTNS2004, Sixteenth International Symposium on Mathematical Theory of Networks and Systems, Katholieke Universiteit Leuven, Belgium, July 5-9, 2004.
- ↑ L. Feng, E.B. Rudnyi, J.G. Korvink, "Parametric Model Reduction to Generate Boundary Condition Independent Compact Thermal Model", THERMINIC 2004, 10th International Workshop on Thermal Investigations of ICs and Systems, 29 September - 1 October 2004, Sophia Antipolis, Cote d'Azur, France.
- ↑ L. Feng, E. B. Rudnyi, J. G. Korvink, "[10.1109/TCAD.2005.852660 Preserving the film coefficient as a parameter in the compact thermal model for fast electro-thermal simulation]", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 24(12): 1838--1847, 2005.
- ↑ J.G. Korvink, E.B. Rudnyi, Oberwolfach Benchmark Collection, Dimension Reduction of Large-Scale Systems, Lecture Notes in Computational Science and Engineering, vol 45: 311--315, 2005.
- ↑ E.B. Rudnyi, J.G. Korvink, Boundary Condition Independent Thermal Model, Dimension Reduction of Large-Scale Systems, Lecture Notes in Computational Science and Engineering, vol 45: 345--348, 2005.